Mitarbeiter

M. Sc. Isabella Lau

Kontakt

  • E-Mail:
  • Telefon: 09131/85-27185
  • Fax: Neu:09131/85-28730
  • Raum: 01.178 D
  • Neu: Wetterkreuz 15
    91058 Erlangen

Über Isabella Lau

Lebenslauf

Isabella Lau schloss ihr Masterstudium im Fachbereich "Elektrotechnik, Elektronik und Informationstechnik" mit der Studienrichtung "Allgemeine Elektrotechnik" an der Friedrich-Alexander-Universität Erlangen-Nürnberg im Juni 2017 mit Auszeichnung ab. Seit August 2017 ist sie am Lehrstuhl für Technische Elektronik im Team Circuits, Systems und Hardware Test (CST) als wissenschaftliche Mitarbeiterin beschäftigt.

Arbeitsgebiete

  • HF-Schaltungsdesign
  • Feldsimulationen mittels CST Studio Suite
  • Materialcharakterisierung

Abschlussarbeiten

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Lehrveranstaltungen Wintersemester 2018

Preise & Auszeichnungen

  • I. Lau, Förderung einer Kongressreise (EuMW 2018), Deutscher Akademischer Austauschdienst, 2018. [Bibtex]
    @prize{lau_prize_2018,
    author = {Lau, Isabella},
    booktitle = {Deutscher Akademischer Austauschdienst},
    cris = {lau_prize_2018},
    year = {2018},
    title = {Förderung einer Kongressreise (EuMW 2018)},
    type = {20773-Kleiner Preis},
    }

COPYRIGHT NOTICE: Copyright and all rights of the material above are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by the appropriate copyright. The material may not be reposted without the explicit permission of the copyright holder.

COPYRIGHT NOTICE FOR IEEE PUBLICATIONS: © IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

COPYRIGHT NOTICE FOR EUMA PUBLICATIONS: © EUMA. Personal use of this material is permitted. Permission from European Microwave Association(EUMA) must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

Publikationen

2019

  • B. Scheiner, F. Lurz, F. Michler, I. Lau, J. Lichtblau, R. Weigel, and A. Koelpin, "Design of a Rotary Coupler for Data Transmission on Fast Rotating Mechanical Shafts and Roboter Arms" in IEEE Radio and Wireless Symposium (RWS), Orlando, FL, USA, 2019. [Bibtex]
    @inproceedings{scheiner2019,
    author = {Scheiner, Benedict and Lurz, Fabian and Michler, Fabian and Lau, Isabella and Lichtblau, Johann and Weigel, Robert and Koelpin, Alexander},
    booktitle = {IEEE Radio and Wireless Symposium (RWS)},
    cris = {https://cris.fau.de/converis/publicweb/publication/204085644},
    year = {2019},
    month = {01},
    day = {20},
    eventdate = {2019-01-20/2019-01-23},
    faupublication = {yes},
    peerreviewed = {unknown},
    title = {Design of a Rotary Coupler for Data Transmission on Fast Rotating Mechanical Shafts and Roboter Arms},
    type = {Konferenzschrift},
    venue = {Orlando, FL, USA},
    }

2018

  • I. Lau, M. Frank, K. Shi, F. Lurz, A. Talai, R. Weigel, and A. Koelpin, "An Accurate Free Space Method for Material Characterization in W-Band Using Material Samples with Two Different Thicknesses" in European Microwave Conference (EuMC), Madrid, Spain, 2018, pp. 202-205. [DOI] [Bibtex]
    @inproceedings{lau2018a,
    abstract = {This paper presents an accurate free space method for material characterization eliminating the problem
    of the required precise orientation between the material and the antennas and expanding the unambiguous range for electrical thick samples. It includes theoretical considerations and measurement results of four different materials. Overall, a maximum measurement uncertainty of 0.0153 for the relative permittivity and 0.001 for the loss tangent in the W-band can be achieved. Depending on the variation of the material’s thickness, the implemented setup changes lead to an reduction of the measurement uncertainty of 8 to 58%.
    }, author = {Lau, Isabella and Frank, Martin and Shi, Kilin and Lurz, Fabian and Talai, Armin and Weigel, Robert and Koelpin, Alexander}, language = {English}, booktitle = {European Microwave Conference (EuMC)}, cris = {https://cris.fau.de/converis/publicweb/publication/200562733}, year = {2018}, month = {09}, day = {25}, doi = {10.23919/EUMC.2018.8541437}, eventdate = {2018-09-25/2018-09-27}, faupublication = {yes}, keywords = {permittivity,dielectric materials,microwave measurement,materials nondestructive testing}, pages = {202--205}, peerreviewed = {unknown}, title = {An Accurate Free Space Method for Material Characterization in W-Band Using Material Samples with Two Different Thicknesses}, type = {Konferenzschrift}, url = {https://ieeexplore.ieee.org/document/8541437}, venue = {Madrid, Spain}, }
  • I. Lau, F. Michler, A. Talai, R. Weigel, and A. Koelpin, "A Resonant Substrate Integrated Waveguide Measurement System for True Relative Permittivity Extraction of PCB Materials up to 90 GHz" in IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes (IMWS-AMP), Ann Arbor, 2018, pp. 1-3. [DOI] [Bibtex]
    @inproceedings{lau2018,
    abstract = {This paper presents a resonant measurement method based on substrate integrated waveguide cavities for
    determination of the true relative permittivity of a PCB material. The sensor is manufactured on the unknown PCB material and in contrast to existing, comparable methods, the extraction process takes into account the metal roughness. The proposed method does not require any reference materials or sensors on different
    PCB thicknesses. This paper contains considerations regarding the design and simulation as well as measurement results of the sensor system. To validate the measurement system, the extracted relative permittivity values of the RO4350B substrate over the frequency range of 10 GHz to 90GHz are presented.
    }, author = {Lau, Isabella and Michler, Fabian and Talai, Armin and Weigel, Robert and Koelpin, Alexander}, language = {English}, booktitle = {IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes (IMWS-AMP)}, cris = {https://cris.fau.de/converis/publicweb/publication/200563113}, year = {2018}, month = {07}, day = {16}, doi = {10.1109/IMWS-AMP.2018.8457133}, eventdate = {2018-07-16/2018-07-18}, faupublication = {yes}, pages = {1--3}, peerreviewed = {unknown}, title = {A Resonant Substrate Integrated Waveguide Measurement System for True Relative Permittivity Extraction of PCB Materials up to 90 GHz}, type = {Konferenzschrift}, venue = {Ann Arbor}, }

COPYRIGHT NOTICE: Copyright and all rights of the material above are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by the appropriate copyright. The material may not be reposted without the explicit permission of the copyright holder.

COPYRIGHT NOTICE FOR IEEE PUBLICATIONS: © IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

COPYRIGHT NOTICE FOR EUMA PUBLICATIONS: © EUMA. Personal use of this material is permitted. Permission from European Microwave Association(EUMA) must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.